Nonthermal Equilibrium Process of Charge Carrier Extraction in Metal/Insulator/Organic Semiconductor/Metal (MIOM) Junction

This paper presents the concept and experimental evidence for nonthermal equilibrium (NTE) process of charge carrier extraction in metal/insulator/organic semiconductor/metal (MIOM) capacitors. These capacitors are structurally similar to metal/insulator/semiconductor/(metal) (MIS) found standard semiconductor textbooks. The difference between two is that (organic) contacts MIOM Schottky type, whereas MIS ohmic type. Moreover, mobilities most organic semiconductors significantly lower than those inorganic semiconductors. As structure identical electrode portion an field-effect transistor (OFET) with top-contact bottom-gate electrodes, hysteretic behavior OFET transfer characteristics can be deduced from NTE phenomenon observed